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TC74HC07AF

TC74HC07AF资料
TC74HC07AF
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File Size : 116 KB
Manufacturer:TOS
Description:Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to F244 and BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation Synchronous to Test Access Port (TAP) Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin SCOPE™ Instruction Set C IEEE Standard 1149.1-1990 Required   Instructions, Optional INTEST, CLAMP   and HIGHZ C Parallel-Signature Analysis at Inputs C Pseudo-Random Pattern Generation   From Outputs C Sample Inputs/Toggle Outputs Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)
 
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型 号:TC74HC07AF
厂 家:TOS
封 装:SOP14
批 号:0633+PBF
数 量:1950
说 明:绝对原装深圳现货/底价
 
 
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